Repository of Research and Investigative Information

Repository of Research and Investigative Information

Rafsanjan University of Medical Sciences

Investigation of EEG changes during exposure to extremely low-frequency magnetic field to conduct brain signals

(2014) Investigation of EEG changes during exposure to extremely low-frequency magnetic field to conduct brain signals. Neurological Sciences. pp. 1715-1721. ISSN 1590-1874

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Abstract

There are evidences that confirm the effect of magnetic fields (MFs) on brain signals and some psychological disorders such as headache, migraine and depression. The aim of the present study was to investigate changes in EEG power spectrum due to localized exposure in different parts of the brain by extremely low-frequency magnetic fields (ELF-MFs) to extract some protocols for treatment of some psychological disorders. In addition, regular effects were investigated by increasing intensity of ELF-MF. Therefore, EEG relative power spectrum was evaluated at T4, T3, F3, F4, and Cz points, when all the points were exposed to MFs with 45, 17, 10, 5, and 3 Hz frequencies, separately. Intensity of MF was 0, 100, 240, or 360 mu T in four sessions. Significant changes were observed in different EEG bands caused by locally exposing to ELF-MF in different points of brain (P < 0.05). Some exposure to MFs decreased alpha band of frontal and central areas in closed-eyes state. Based on the findings in this study, some protocols can be designed using a combination of various MFs exposures to conduct the brain signals that is necessary to evaluate clinically.

Item Type: Article
Keywords: ELF magnetic fields EEG Local exposure Regular effects Psychological disorders electromagnetic-fields 50 hz alpha-activity memory parameters sensitivity attention humans Neurosciences & Neurology
Page Range: pp. 1715-1721
Journal or Publication Title: Neurological Sciences
Journal Index: ISI
Volume: 35
Number: 11
Identification Number: https://doi.org/10.1007/s10072-014-1819-0
ISSN: 1590-1874
Depositing User: مهندس مهدی شریفی
URI: http://eprints.rums.ac.ir/id/eprint/4611

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